測定器開発室セミナー

日時: 2015-01-28 16:00 - 17:30
場所: 3号館3階会議室
会議名: R&D on Counting Pixel Chips
連絡先: mibe at post.kek.jp
講演者: Dr. Yunpeng Lu  (IHEP)
講演言語: 英語
URL: http://rd.kek.jp/seminar_01.html
アブストラクト: Shielding is a key issue in SOI pixel technology and counting
pixel is an effective measure to study it. In addition, counting pixel is getting more
and more porpular in synchrotron radiation application. IHEP group joined this R&D
effort since 2012, and submitted two chips so far. One adopted nested-wells and
the second adopted double SOI to implement shielding. After two iterations, different
circuit and shielding scheme have been designed and tested. The results and
improvement considerations will be introduced in this talk.

[index]