| 日時: |
2015-04-21 16:00 - 17:30 |
| 場所: |
4号館３階輪講室１ |
| 会議名: |
SiGe technology for HEP readout ASICs |
| 連絡先: |
中村 勇 |
| 講演者: |
Prof. Christoph de la Taille (Ecole Polytechnique,CNRS/IN2P3) |
| 講演言語: |
英語 |
| URL: |
http://rd.kek.jp/seminar_01.html |
| アブストラクト: |
Silicon Germanium technology offers interesting advantages In the quest
for high speed, low power, low noise readout ASICs, in particular for
large dynamic range applications such as calorimetry. OMEGA laboratory
at Ecole Polytechnique and CNRS/IN2P3 (France) has been designing ASICs
in SiGe 350nm for over a decade (the "ROC family") used by various
experiments (ATLAS, CALICE, JEM/EUSO, PET...) and various detectors
(PMT, MPPC, RPCs...). Salient features will be presented together with
experimental results.
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