| 日時: |
2013-02-18 10:30 - 11:30 |
| 場所: |
PF研究棟2階会議室 |
| 会議名: |
物構研談話会（12-37）X-ray Fluorescence Microscopy Beamline at the Australian Synchrotron |
| 連絡先: |
河田洋 6193 |
| 講演者: |
Ms. Kathryn Spiers (ANBF-PF) |
| 講演言語: |
英語 |
| アブストラクト: |
The X-ray Fluorescence Microscopy beamline at the Australian Synchrotron
is a hard X-ray micro-nanoprobe operating at incident energies from 4 to
25 keV. The main mode of operation of the beamline is 2D elemental mapping, with the 3D techniques of XANES imaging and X-ray Fluorescence tomography extending the capabilities of the beamline. Rapid collection of XFM data is enabled by the unique Maia detector system, which utilises a large, 384-element detector array, continuous “on-the-fly” scanning and event-by-event processing to achieve high data rates,
essentially zero overheads and short transit times. The beamline has
applications to a wide range of cientific fields, from biological,
biomedical and life sciences, though to environmental and geological
applications, as well as large-scale investigations of artworks and
cultural heritage. This seminar will provide an overview of the beamline
as well as examples of research conducted using this facility.
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