| 日時: |
2013-06-14 13:30 - 14:30 |
| 場所: |
4号館2階輪講室1、東海1号館324室 |
| 会議名: |
物構研談話会（13-08）Measurement of Topological Structure in Amorphous Solids using Coherent Diffraction |
| 連絡先: |
熊井玲児 6024 |
| 講演者: |
Dr. J. Murray Gibson (Department of Physics, Northeastern University) |
| 講演言語: |
英語 |
| アブストラクト: |
Glasses and other amorphous solids are widely used for their mechanical, optical and electronic properties, yet the correlation between properties and structure is poorly understood. One missing link is“medium-range-order” (MRO) which often arises from topological atomic structure. While important to properties, MRO has been notoriously hard to study because conventional diffraction gives only short-range order. Using coherent diffraction techniques such as Fluctuation Electron Microscopy (FEM)(1) , this problem can be solved. We describe the techniques and its applications to amorphous semiconductors in detail. The use of transmission electron diffraction and x-ray diffraction is discussed. We also review some other applications, including the promise of FEM’s use in studying partially-ordered organic and biological systems. (1) Gibson, J. M.; Treacy, M. M. J.; Sun, T.; et al., Phys. Rev. Lett., 105 , p125504 (2012). |
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