| 日時: |
2008-09-02 13:30 - 14:30 |
| 場所: |
研究棟2階会議室 |
| 会議名: |
放射光セミナー「Bayes-Turchin approach to the analysis of extended x-ray absorption fine structure data」 |
| 講演者: |
Dr. Hans. J. Krappe (Helmholtz Center Berlin) |
| 講演言語: |
英語 |
| URL: |
http://pfwww.kek.jp/pf-semiar/index.html |
| アブストラクト: |
After a reminder of the Bayes-Turchin approach to data analysis in general, its application to x-ray absorption fine structure (EXAFS) and magnetic x-ray absorption (MEXAFS) data is discussed in the framework of the multiple scattering path expansion. |
