| 日時: |
2010-10-21 13:30 - 14:30 |
| 場所: |
4号館セミナーホール/東海１号館324号室 |
| 会議名: |
物構研セミナー「X-ray Microscopy」 |
| 講演者: |
Professor David Attwood (University of California, Berkeley) |
| 講演言語: |
英語 |
| URL: |
http://pfwww.kek.jp/pf-seminar/ |
| アブストラクト: |
We discuss world-wide progress towards nanoscale x-ray imaging in a wide range of applications, including materials science, biology, environmental science, cultural heritage, and industrial applications. Experiments involve both soft and hard x-rays Techniques include diffractive zone plate imaging, glancing angle reflective optics, multilayer coatings, novel optics and nanoscale 3D tomographic reconstructions.
This IMSS seminar forms a part of the Cheiron School 2010 which will be held at the Spring-8 on October 9-18 as a one of important activities of the Asia-Oceania Forum for Synchrotron Radiation Research.
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