| アブストラクト: |
It is well-known that the inelastic X-ray scattering (IXS)intensity is directly related to the dynamical charge susceptibility. Thespectrum of IXS in the energy between meV and a few 100meV, which is important energy range to investigate the physical properties in materials, has been explained so far with a contribution of oscillatingions, "phonons". Of course this is not correct. The spectrum should have the information on dynamical dielectric function which consists of not only phonons, but also polarization properties of electrons in a field of rigid lattice. The talk is addressed to the idea how to get the information on dynamical electric function by a combination of x-ray and neutron inelastic scattering methods. |
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