| 日時: |
2003-04-15 15:00 - 17:00 |
| 場所: |
PF研究棟2階会議室 |
| 会議名: |
放射光セミナー「X-ray Detector Development at the Swiss Light Source (SLS)」 |
| 講演者: |
Prof.Eric.F.Eikenberry (Swiss Light Source, Paul Scherrer Institute ) |
| 講演言語: |
英語 |
| URL: |
http://pfwww.kek.jp/pf-seminar/ |
| アブストラクト: |
An important application of synchrotron light is determining the structure of large molecules by x-ray crystallography. The intensity and collimation of 3rd generation sources are steadily improving the quality of x-ray diffraction data, and leading to the solution of ever more difficult structures. However, recording these data optimally places increasingly severe demands on the x- ray detector. Storage phosphors, and more recently CCD detectors, have been widely used for macromolecular crystallography, but their limitations in speed and data quality have become apparent. To address these limitations, a large area all-silicon single-photon counting pixel detector is being developed at the SLS. The detector is of modular design, with the final detector having at least 2k x 2k pixels covering an area of ca. 40 x 40 cm . More than 12 modules have been constructed, each consisting of an 80 x 34 mm monolithic silicon sensor with a 2 x 8 array of custom CMOS readout chips bump-bonded to it. The readout chips have a 44 x 78 array of
217 x 217 m pixels each with a 15-bit counter. Experiments with protein crystals carried out
at the SLS demonstrated the suitability of a prototype detector for demanding experiments in which the fine phi-sliced mode of data collection is used. To improve the yield, speed and dynamic range of the detector, the readout chip has been redesigned in a 0.25 m CMOS process. Preliminary tests of this chip show that it works well and should be able to count up to 10 x-rays/s/pixel.
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