The beamline can switch between a soft X-ray path (S) and a tender X-ray path (T), covering a wide energy range of 50 to 5000 eV.
The reflectometer previously eqipped at BL-11D is available.
Area of research
Contacts
Takuji OHIGASHI takuji.ohigashi(at)kek.jp
Please change (at) to @ in the e-mail address.
Notes
The beamline is under construction as a beamline that combines the functions of the former BL-11A, 11B, and 11D.
The call for proposals is scheduled to begin in the second half of FY2023. However, depending on the progress of construction, the timing of use is not decided yet. At first, the tender X-ray path (1700 - 5000 eV) will be available and the soft X-ray path will be opened later (hopefully in FY2024).
Those who have valid proposals that were conducted in the former BL-11A, 11B, and 11D can continue to conduct experiments in BL-12A.
Performance
Source
2.5GeV PF Bending magnet (B12)
Optics
Soft X-ray path : Variable line spacing plane grating monochromator
Tender X-ray path : Double crystal monochromator [Si(111) or InSb(111)]
Conceptual diagram of optics of BL-12A (Side view)
Energy range
Soft X-ray path : (50) 70 - 2000 eV
(Below 70 eV, only available with defocus) [hopefully available from FY2024]
A reflectometer
The incidence angle varies between 5 and 89 degrees. The angular resolution < 0.1° in reflectivity measurements is available. A sample of φ200 mm can be mounted on the sample stage. It is also possible to place multiple small samples on the stage. The ultimate vacuum of the reflectometer chamber is 1 × 10-5 Pa.
