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4. BL-12A : Soft and Tender X-ray Beamline

BL-12A : Soft and Tender X-ray Beamline

Overview

Beamline group	Subcommittee 1 (Soft X-ray absorption spectroscopy)
Techniques	Soft X-ray absorption spectroscopy Reflectometry
Features	The beamline can switch between a soft X-ray path (S) and a tender X-ray path (T), covering a wide energy range of 50 to 5000 eV. The reflectometer previously eqipped at BL-11D is available.
Area of research
Contacts	Takuji OHIGASHI takuji.ohigashi(at)kek.jp Please change (at) to @ in the e-mail address.
Notes	The beamline combines the functions of the former BL-11A, 11B, and 11D.

Performance

Source	2.5GeV PF Bending magnet (B12)
Optics	Soft X-ray path : Variable line spacing plane grating monochromator Tender X-ray path : Double crystal monochromator [Si(111) or InSb(111)]
Energy range	Soft X-ray path : (50) 70 - 2000 eV (Below 150 eV and above 1200eV, in preparation) Tender X-ray path : 1700 - 5000 eV
Resolution (ΔE/E)	Soft X-ray path : < 4000 Tender X-ray path : ~5000 [Si(111)], 1600 [InSb(111)]
Beam size	Soft X-ray path : ~0.55 (H) × 0.08 (V) mm Tender X-ray path : ~0.5 (H) × 0.7 (V) mm
Photon flux	2.5 × 1010 @ 800 eV
Instruments	TEY/FY XAFS chamber A reflectometer The incidence angle varies between 5 and 89 degrees. The angular resolution < 0.1° in reflectivity measurements is available. A sample of φ200 mm can be mounted on the sample stage. It is also possible to place multiple small samples on the stage. The ultimate vacuum of the reflectometer chamber is 1 × 10-5 Pa.
Detectors	SDD for FY XAFS chamber
Remote / Mail-in	not available
Special notes	Schecule depends on the construction process.

References

Publications

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Last updated: 2024-8-2