BL-20B : White & Monochromatic X-ray Topography and Diffraction

Beamline group	Group 6 (Imaging)
Techniques	X-ray topography with monochromatic and white beam
Features	Laue topography (white beam) Monochromatic X-ray topography Related diffraction experiments
Area of research	Crystal defect research by X-ray diffraction topography
Contacts	Hiroshi SUGIYAMA hiroshi.sugiyama(at)kek.jp Please change (at) to @ in the e-mail address.
Special notes

Source	2.5GeV PF Bending magnet (B20)
Optics	Si (111) double-crystal monochromator with constant exit beam height
Energy range	4 - 25 keV, white
Resolution
Beam size	MAX about 25 mm (H) x 5 mm (V)
Photon flux	MAX about 1 x 10¹² photons/s/ @ 10 keV
Instruments	White X-ray topography goniometer with vertical axis Precision X-ray topography goniometer with horizontal axis 1/100-second high-speed shutter vacuum path
Detectors	PIN photodiode detector NaI scintillation counter ion chamber (with N₂ gas)
Remote / Mail-in	Not available
Special notes

Shigeo SUZUKI, Masami ANDO, Kazuriobu HAYAKAWA, Osamu NITTONO, Hiroo HASHIZUME, Seigo KISHINO and Kazutake KOHRA,, A HIGH-SPEED X-RAY TOPOGRAPHY CAMERA FOR USE WITH SYNCHROTRON RADIATION AT THE PHOTON FACTORY, Nucl. Instrum. Methods in Physics Research, 227, 584 (1984), doi:10.1016/0168-9002(84)90219-5

Last updated: 2021-12-11