BL-4B2 : Powder diffraction station

Beamline group	Group 2 (Diffraction and Scattering)
Techniques	Powder crystal X-ray diffraction High temperature (1500 ℃) measurement
Features	High resolution PXRD (Scintillation counter with analyzer crystal) by reflection or transmission method High temperature measurement under air condition
Area of research	Ceramics, mineralogy, battery material, pharmaceutical crystals MEM/Rietveld method, accurate measurement of diffraction peaks
Organization	Operated by Powder diffraction user group
Contacts	Photon Factory：Hironori NAKAO hironori.nakao(at)kek.jp Powder diffraction UG：Hidehiro UEKUSA uekusa(at)chem.titech.ac.jp Please change (at) to @ in the e-mail address.
Special notes	Support for novice user by UG members

Source	2.5-GeV PF ring : Bending magnet (B04)
Optics	Double crystal monochromator [Si(111)] Rh coated Si single crystal pseudo toroidal mirror
Energy range	6 - 20 keV（1.8 - 0.7 Å）
Resolution (ΔE/E)	Ca. 2 x 10^-4
Beam size	3 mm (H) x 2 mm (V)
Photon Flux
Instruments	Multi detector type X-ray diffractometer High temperature sample heater (1500 ℃)
Detectors	Scintillation counter with Ge(111) analyzer crystal
Remote / Mail-in
Special notes

H. Toraya, H. Hibino and K. Ohsumi, J. Synchrotron Rad., 3, 75 (1996), doi:10.1107/S0909049595015500
T. Ida, H. Hibino and H. Toraya, J. Appl. Cryst., 34, 144 (2001), doi:10.1107/S0021889800021105
T. Ida and H. Hibino, J. Appl. Cryst., 39, 90 (2006), doi:10.1107/S0021889805040318
M. Yashima, M. Tanaka, K. Oh-uchi and T. Ida, J. Appl. Cryst., 38, 854 (2005), doi:10.1107/S0021889805020583
M. Yashima, K. Oh-uchi, M. Tanaka and T. Ida, J. Am. Ceram. Soc., 89, 1395 (2006), doi:10.1111/j.1551-2916.2005.00865.x

Last updated: 2021-8-23