Photon Factory

KEK
  1. PF-HOME
  2. Beamlines
  3. Beamline List
  4. AR-NW2A : Time-resolved XAFS and X-ray microscopy

AR-NW2A : Time-resolved XAFS and X-ray microscopy

Overview

Beamline group Group 3 (X-ray spectroscopy)
Techniques
  • Time-resolved XAFS (DXAFS)
  • 2D imaging XAFS
  • Other experiment with monochromatized X-rays (Please contact with the beamline scientist.)
Features
  • An experimental station has been designed for hard X-ray XAFS experiments.
  • Time-resolved XAFS (DXAFS) is available.
Area of research
  • Materials Chemistry
  • Materials Engineering
  • Earth and Environmental Science
  • Biological Science etc.
Contacts
  • Manager : Yasuhiro NIWA yasuhiro.niwa(at)kek.jp
  • Sub manager : Hitoshi ABE hitoshi.abe(at)kek.jp
  • Sub manager : Takeharu MORI takeharu.mori(at)kek.jp
  • Sub manager : Hiroaki NITANI hiroaki.nitani(at)kek.jp
    • Please change (at) to @ in the e-mail address.
Special notes
  • When you planning any experiment, please contact us before submit your research proposal.
  • You have to submit "experimental plan" before experiment. Please check PFXAFS website

Performance

Source
  • 6.5/5.0-GeV PF-AR Undulator (ID2)
    Periodic length 40 mm, Number of Periods 90
  • Horizontal acceptance 1 mrad (H) and 0.2 mrad (V)
Optics
  • Numerical-drive, LN2 cooled double Si(111) crystal monochromator, White beam mode is available
  • Rh coated bent cylinder mirror for focusing
  • Rh coated bent flat mirror for focusing
  • Rh/Ni coated double flat mirror for higher harmonics reduction
Energy range
  • 5 - 25 keV
Resolution (ΔE/E)
  • ~ 2 x 10-4
Beam size
  • Cylinder mirror focusing: 0.6 mm (H) x 0.2 mm (V)
  • Flat mirror focusing: 10 mm (H) x 0.06 mm (V)
  • Non-focusing: 8 mm (H) x 3 mm (V)
Photon flux
  • 6 x 1012 photons/s (12 keV)
Instruments
  • Standard XAFS experiment system (Transmission and Fluorescent mode)
  • DXAFS experiment system
  • 2D imaging XAFS system (Spatial resolution < 10 µn;m)
Detectors
  • Ionization chamber (5 cm, 17 cm ,31 cm)
  • Lytle detector
  • Photo diode array detector and Si-microstrip detector for DXAFS
  • ORCA Flash 4.0
Remote / Mail-in
  • Not available
Special notes
  • Users instruments : acceptable (Please contact with the beamline manager.)
  • Experimental hutch : 3.0 m (L) x 3.8 m (W) x 3.0 m (H)
  • Hutch door : 2.6 m (W) x 2.4 m (H)
  • Electric power, high-pressure gas available

More information

References

  1. T. Mori et al., AIP Conf. Proc., 705, 255 (2004), doi: 10.1063/1.1757782
  2. H. Kawata et al., AIP Conf. Proc., 705, 663 (2004), doi: 10.1063/1.1757883
  3. Y. Inada et al., AIP Conf. Proc., 879, 1230 (2007), doi: 10.1063/1.2436286
  4. Y. Niwa et al., AIP Conf. Proc., 2054, 050003 (2019), doi: 10.1063/1.5084621
  5. M. Katayama et al., J. Synchrotron Radiat., 22, 1227 (2017), doi:10.1107/S1600577515012990
  6. T. Shirasawa e-J. Surf. Sci. Nanotechnol., 17, 155 (2019), doi: 10.1380/ejssnt.2019.155
  7. M. Katayama et al., Anal. Sci., 36, 47 (2020), doi:10.2116/analsci.19SAP02

Publications

KEK-PF Publication Database (Publications of AR-NW2A)

プレスリリース・関連記事


Last updated: 2021-8-24

 Page Top