Photon Factory


BL-19A/B : Soft X-ray microscopy (STXM) and spectroscopy


Beamline group  Subcommittee 1 (Soft X-ray Microscopy)
  • Scanning Transmission X-ray Microscopy (STXM)
  • X-ray absorption spectroscopy (XAS)
  • 2 branches (A: STXM, B: Freeport) are available.
  • Various types of polarized light are available in the soft X-ray region.
  • XAS measuring equipment is available at the B branch, and you can bring your own equipment and install it.
Area of research
  • Resin material
  • Meteorite, minerals, environmental samples
  • Magnetic material (using polarized light)
  • Catalysts, batteries, etc.
  • Shohei YAMASHITA shohei.yamashita(at)
  • Please change (at) to @ in the e-mail address.
Special notes [Please contact us below]
  • STXM measurement can be performed in an unexposed environment.
  • STXM measurement by remote operation is possible.


  • 2.5GeV PF, undulator (APPLE-II type)
  • Monk-Gillieson monochromator (diffraction grating lines: 600, 1200 lines / mm)
Energy range
  • A branch : 160 - 1900 eV
  • B branch : 90 - 2000 eV
  • c.a. 5000
Beam size
  • B branch : ~ 200 μm (H) x 50 μm (V)
Photon flux
  • B branch : 2.4 x 1011 photons/s(@400 eV)
  • A branch : Scanning Transmission X-ray Microscope (STXM)
    Spacial resolution : ~ 30 nm
    B, C, N, O, F, Na, Mg, Al, Si (K-edge), S, Cl, K, Ca, 3d transition metal (L-edge), 4f rare earth (M-edge) can be measured.
  • B branch : XAS measuring equipment
  • Detector for total electron yield (sample current), fluorescence (silicon drift detector), transmission (photodiode).
Remote / Mail-in
  • Possible (please consult with the person in charge)
Special notes
  • In the B branch (free port), the equipment size can be installed is 1600 x 2000 mm.


  1. S. Sasaki et al., Nucl. Instrum. Meth. Phys. Res., A331, 763 (1993), doi: 10.1016/0168-9002(93)90153-9 : APPLE-II type undulator
  2. K. Amemiya and T. Ohta, J. Synchrotron Rad., 11, 171 (2004), doi:10.1107/S0909049503023598 : Monk-Gillieson monochromator
  3. Y. Takeichi et al., Rev. Sci. Instrum., 87, 013704 (2016), doi:10.1063/1.4940409 : Scanning Transmission X-ray Microscopy (STXM)


KEK-PF Publication Database (Publications of BL-19A/B)

Last updated: 2021-9-9