BL-7C : Versatile Hard X-ray Experiment

Beamline group	Subcommittee 2 (Diffraction and Scattering)
Techniques	monochromatic X-ray for general purpose
Features	your own experimental equipment available monochromatic X-ray sagittally focusing in horizontal double total reflection mirror for high-order diffraction removal focusing in vertical by the mirror downward X-ray beam available various gases for ion chambers available
Area of research	X-ray diffraction structure analysis for thin film secondary X-ray emission spectroscopy X-ray anomalous scattering structure analysis XAFS for solution surface
Contacts	Hiroshi SUGIYAMA hiroshi.sugiyama(at)kek.jp Please change (at) to @ in the e-mail address.
Special notes

Source	2.5GeV PF Bending magnet (B07)
Optics	sagittally focusing Si (111) double-crystal monochromator with constant exit beam height double total reflection mirror
Energy range	4 - 20 keV
Resolution
Beam size	MAX　about 80 mm (H) x 8 mm (V) MIN　about 1 x 1 mm² (focused)
Photon flux	MAX about 1 x 10¹² photons/s @ 10 keV
Instruments	X-ray thin film diffractometer (SOR-SmartLab) X-ray anomalous scattering diffractometer (AXS-1) X-ray emission spectroscope (Escargot) XAFS equipment (user-managed except for XAFS related equipment)
Detectors	Ionization chamber (with N₂, Ar, and mixed gas)
Remote / Mail-in	Not available
Special notes

Last updated: 2022-2-10