BL-1 [N. Matsugaki] |
| BL-1A |
SGU |
|
Macromolecular Crystallography |
N. Matsugaki |
|---|
BL-2 [T. Ohigashi] |
| BL-2A/B |
U |
|
Multiple Undulator beamline for Spectroscopic Analysis of Surface and HeteroInterface : MUSASHI and Photoelectron Spectroscopy Station |
T. Ohigashi |
|---|
BL-3 [H. Nakao] |
| BL-3A |
SGU |
|
X-ray Diffraction Experiment under Extreme Condition |
H. Nakao |
|---|
| BL-3B |
BM |
UG |
VUV Photoelectron Spectroscopy |
K. Ozawa/T. Sakurai (Univ. Tsukuba), J. Yoshinobu (Univ. Tokyo) |
|---|
| BL-3C |
BM |
|
X-ray Optics/White X-ray Magnetic Diffraction |
K. Hirano |
BL-4 [H. Nakao] |
| BL-4A |
BM |
UG |
Trace Element Analysis/X-ray Microbeam |
Y. Niwa/M. Uo(Science Tokyo) |
| BL-4B2 |
BM |
UG |
Powder Diffraction |
D. Okuyama/H.Uekusa(Science Tokyo) |
|---|
| BL-4C |
BM |
|
X-ray Diffraction Experiment |
H. Nakao |
|---|
BL-5 [N. Matsugaki] |
| BL-5A |
MPW |
|
Macromolecular Crystallography |
N. Matsugaki |
|---|
BL-6 [H. Takagi] |
| BL-6A |
BM |
|
Small-angle X-ray Scattering |
H. Takagi |
|---|
| BL-6C |
BM |
UG |
X-ray Diffraction and Scattering |
D. Okuyama/N. Happo (Hiroshima City Univ.) |
BL-7 [K. Amemiya/J. Okabayashi (Univ. Tokyo)] |
BL-7A
RCS, Univ. Tokyo |
BM |
EX |
Soft X-ray Spectroscopy |
K. Amemiya/J. Okabayashi (Univ. Tokyo) |
|---|
| BL-7C |
BM |
|
Multi-purpose Hard X-ray Experiment |
H. Sugiyama |
BL-8 [D. Okuyama] |
| BL-8A |
BM |
|
Powder/Single-crystal Diffraction under Extreme Conditions |
D. Okuyama |
| BL-8B |
BM |
|
Powder/Single-crystal Diffraction under Extreme Conditions |
D. Okuyama |
|---|
BL-9 [H. Abe] |
| BL-9A |
BM |
|
High-intensity and Low-energy XAFS |
H. Abe |
|---|
| BL-9C |
BM |
|
in-situ XAFS |
H. Abe |
|---|
BL-10 [H. Takagi] |
| BL-10A |
BM |
UG |
X-ray Diffraction and Scattering |
R. Kumai/T. Kuribayashi (Tohoku Univ.) |
| BL-10C |
BM |
|
Small-angle X-ray Scattering |
H. Takagi |
BL-11 [D. Wakabayashi] |
| BL-11A |
BM |
|
R&D Beamline |
D. Wakabayashi |
|---|
| BL-11B |
BM |
|
R&D Beamline |
D. Wakabayashi |
|---|
BL-12 [T. Ohigashi] |
| BL-12A |
BM |
|
Soft and Tender X-ray Beamline |
T. Ohigashi |
|---|
| BL-12C |
BM |
|
High-throughput XAFS |
D. Kido |
|---|
BL-13 [K. Mase] |
| BL-13A/B |
U |
|
Variable Polarization VUV and Soft X-ray Spectroscopy |
K. Mase |
|---|
BL-14 [K. Hirano] |
| BL-14A |
VW |
|
Single Crystal Structure Analysis/Detector Development |
H. Sagayama |
|---|
| BL-14B |
VW |
|
High-precision X-ray Optics |
K. Hirano |
|---|
| BL-14C |
VW |
|
X-ray Imaging and Multi-purpose Experiments |
K. Hirano |
|---|
BL-15 [Y. Niwa] |
| BL-15A1 |
SGU |
|
Semi-microbeam XAFS |
Y. Niwa |
|---|
| BL-15A2 |
SGU |
|
High-brilliance Small-angle X-ray Scattering |
H. Takagi |
|---|
BL-16 [K. Amemiya] |
| BL-16A |
U |
|
Variable Polarization Soft X-ray Spectroscopy |
K. Amemiya |
BL-17 [M.Hikita] |
| BL-17A |
SGU |
|
Macromolecular Crystallography |
M.Hikita |
BL-18 [R. Kumai] |
BL-18B
DST, India |
BM |
EX |
Versatile Hard X-ray Station |
H. Nakao/
Subhadip Chowdhury(JNCASR) |
| BL-18C |
BM |
UG |
High Pressure X-ray Powder Diffraction (DAC) |
Y. Shibazaki/H. Kagi(Univ. of Tokyo) |
|---|
BL-19 [S. Yamashita] |
| BL-19A/B |
U |
|
Soft X-ray Microscopy (STXM) and Spectroscopy |
S. Yamashita |
BL-20 [J. Adachi] |
| BL-20A |
BM |
UG |
VUV Spectroscopy |
J. Adachi/Y.Hikomasa(Univ. of Toyama) |
| BL-20B |
BM |
|
White & Monochromatic X-ray Topography and Diffraction |
H. Sugiyama |
|---|
BL-27 [N. Usami] |
| BL-27A |
BM |
UG |
Radiation Biology, Soft X-ray Spectroscopy for Radioactive Samples |
N. Usami/A. Yokoya (QST) / Y. Okamoto (JAEA) |
| BL-27B |
BM |
UG |
Radiation Biology, XAFS for Radioactive Samples |
N. Usami/A. Yokoya (QST) / Y. Okamoto (JAEA) |
|---|
BL-28 [K. Ozawa] |
| BL-28A/B |
U |
|
Variable Polarization VUV and Soft X-ray Spectroscopy |
K. Ozawa |
|---|
AR-NE1 [Y. Shibazaki] |
| AR-NE1A |
EMPW |
|
X-Ray Diffraction and Mössbauer Spectroscopy at High Pressure |
Y. Shibazaki |
|---|
AR-NE3 [M.Hikita] |
| AR-NE3A |
U |
|
Macromolecular Crystallography for Drug Design |
M.Hikita |
|---|
AR-NE5 [Y. Shibazaki] |
| AR-NE5C |
BM |
|
High-pressure and High-temperature X-ray Diffraction (MAX-80) |
Y. Shibazaki |
AR-NE7 [K. Hirano] |
| AR-NE7A |
BM |
|
X-ray Imaging and X-ray Diffraction Experiments at High Pressure |
K. Hirano |
AR-NW2 [Y. Niwa] |
| AR-NW2A |
U |
|
Time-resolved XAFS, X-ray Microscopy |
Y. Niwa |
|---|
AR-NW10 [D. Kido] |
| AR-NW10A |
BM |
|
High-energy XAFS |
D. Kido |
|---|
AR-NW12 [M. Hikita] |
| AR-NW12A |
U |
|
Macromolecular Crystallography |
M. Hikita |
|---|
AR-NW14 [S. Nozawa] |
| AR-NW14A |
U |
|
Time-resolved Diffraction and Scattering |
S. Nozawa |
|---|
AR-SE2A [Institute of Particle and Nuclear Studies] |
| AR-SE2A |
(electron beam) |
|
Test Beam Line (in Japanese) |
(N. Igarashi) |
|---|
Slow Positron Facility [K. Wada] |
| SPF-A3 |
SP |
|
TRHEPD (Total-reflection High-energy Positron Diffraction) Station |
K. Wada |
| SPF-A4 |
SP |
|
LEPD (Low-energy Positron Diffraction) Station |
K. Wada |
| SPF-B1 |
SP |
|
General Purpose Slow-positron Experiment Station |
K. Wada |
|---|
| SPF-B2 |
SP |
|
Ps-TOF (Positronium Time-of-flight) Measurement Station |
K. Wada |
|---|
